ArBlade 5000 is a high-performance model of Hitachi ion grinder.
It achieves ultra high speed section grinding.
The high-efficiency cross-sectional processing function makes sample processing easier during electron microscopy cross-sectional observation.
The newly developed PLUSII ion gun emits a high current density ion beam, significantly increasing the grinding rate by 2.
The newly developed PLUSII ion gun emits a high current density ion beam, significantly increasing the grinding rate by 2.
The grinding rate is twice that of our company's product (IM4000PLUS: 2014 production)
Comparison of cross-sectional grinding results
(Sample: Automatic pencil lead, grinding time: 1.5 hours)
Our company's product IM4000PLUS
ArBlade 5000
Using a wide cross-sectional grinding sample holder, the processing width can reach 8 mm, which is very suitable for grinding electronic components and other materials.
The new composite ion grinder (cross-sectional grinding, planar grinding) has received widespread praise.
Samples can be pre processed according to requirements.
Section grinding
Cross section production of soft materials or composite materials that are difficult to handle by cutting or mechanical grinding
Flat grinding
Refinement or surface cleaning of samples after mechanical grinding
| Universal | |
|---|---|
| Use gas | Ar |
| Accelerating voltage | 0～8 kV |
| Section grinding | |
| Fastest grinding rate (material Si) | Above 1 mm/hr * 1, including 1 mm/hr * 1 |
| Maximum grinding width | 8 mm*2 |
| Maximum sample size | 20(W) × 12(D) × 7(H) mm |
| Sample movement range | X ±7 mm、Y 0~+3 mm |
| Intermittent processing function of ion beam | Standard Configuration |
| Swing angle | ±15°、±30°、±40° |
| Flat grinding | |
| Maximum processing range | φ32 mm |
| Maximum sample size | φ50 × 25(H) mm |
| Sample movement range | X 0～+5 mm |
| Intermittent processing function of ion beam | Standard Configuration |
| Rotation speed | 1 r/m、25 r/m |
| Tilt angle | 0～90° |
*1 Si protruding shield edge of 100 µ m, maximum processing depth in 1 hour
*2 When using a wide cross-section grinding sample holder
| Project | Content |
|---|---|
| High wear-resistant shielding plate | The wear-resistant shielding plate is about twice that of the standard shielding plate (excluding cobalt) |
| Processing monitoring microscope | Magnification ratio of 15 ×~100 × for binocular and trinocular models (CCD can be added) |
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