● Optional high temperature testing environment

● Optional straight tube microscope, solid microscope or metallographic microscope, stage air floating for rapid movement, three speed control, X-axis independent control, Y-axis independent control, XY synchronous control, XY synchronous control

● Optional high voltage and high current testing environment

● Quick loading and locking function at any position

● Stable microscope bridge, with a moving resolution of 2um, and pneumatic lifting and lowering of the microscope

● Platen second-order lifting rod, fine adjust the movement stroke to 60mm,

● The repeatability accuracy of the lifting rod is 1um

● Configure independent control pressure valve

● Failure analysis Integrated circuit failure analysis

● Wafer level reliability certification for crystal cells

● Device characterization measurement of component characteristics

● Process modeling plastic process testing (material property analysis)

● ICPProcess monitoring is used to create monitoring

● Package part probing IC packaging stage wire quality testing ESD&TDR testing ESD and TDR testing

● Microwave probing (high-frequency testing)

● Detection and analysis in the field of solar energy

● Detection and analysis in the fields of LED, OLED, and LCD

● PCB field inspection and analysis

● VESELDFB, COC, silicon optical and other optoelectronic device testing

● RF test probe and cable

● Low leakage current/capacitance test

● Laser repair

● Probe card/packaging/PCB board fixture

● Active probe

● High voltage and high current module

● High definition digital camera

● Hot Chuck

● Horizontal adjustment mechanism for the loading platform

● Various models of oscilloscopes

● Various brands of semiconductor parameter analyzers, such as Bocai, Shide, Tektronix, and Kelon

● Various brands of network analyzers, such as Shide, Rohde Schwarz, Siyi, etc

● Source tables for various brands and models