● Optional high temperature testing environment

● Optional straight tube microscope and solid microscope

● Rapid movement of air flotation platform

● Optional high voltage and high current testing environment

● Platen upper and lower structure, capable of simultaneously inserting needles on both sides

● Double sided hollow out stage, replaceable, one hollow fixture, one stage (two suction holes)

● Back mounted straight tube microscope with a zoom of 0.58-7.5x

● Platen fine tuning stroke is 40mm, movement resolution is 1um, four point synchronization

● Failure analysis Integrated circuit failure analysis

● Wafer level reliability certification for crystal cells

● Device characterization measurement of component characteristics

● Process modeling plastic process testing (material property analysis)

● IC Process Monitoring for Manufacturing Monitoring

● Package part probing IC packaging stage wire quality testing

● ESD&TDR testing ESD and ITDR testing

● Microwave probing (high-frequency testing)

● PCB field inspection and analysis

● RF test probe and cable

● Low leakage current/capacitance test

● Laser repair

● Probe card/packaging/PCB board fixture

● Active probe

● High voltage and high current module

● High definition digital camera

● Hot Chuck

● Horizontal adjustment mechanism for the loading platform

● Various models of oscilloscopes

● Various brands of semiconductor parameter analyzers, such as Bocai, Shide, Tektronix, and Kelon

● Various brands of network analyzers, such as Shide, Rohde Schwarz, Siyi, etc

● Source tables for various brands and models