

The Quadra 3 Pro is equipped with industry-leading X-ray detection technology with 750nm feature resolution, capable of generating ultra high definition X-ray images of up to 1.6 million pixels, and displaying them point-to-point on an ultra wide curved display. We use the latest technology to ensure sharp image quality and prevent you from missing any details.
Quadra ® 3Pro is a reliable tool and partner for your high standard X-ray testing. It can provide sufficiently high magnification for quality control applications on the production line. It can effectively detect a series of defects that may occur during production. For example, issues during BGA, QFN, or IGBT chip mounting, PTH tin filling, voids in the bonding surface, component cracking, and identification of counterfeit products.
RevalutionTM control software has simple and intuitive menus and control functions, making it easy to quickly carry out work. The main interface layout can be customized, and each operator can save their preferred layout for a smoother operating experience.
Provide custom filters and image enhancement features to meet your application needs. By simply clicking with the mouse, defect analysis can be quickly completed or automated inspection programs can be generated.
OnyxmTM is independently designed and developed by our team of semiconductor experts, committed to providing the best performance in the industry. The imaging unit has world-class specifications and can simultaneously meet the high sensitivity required in low light conditions and the saturation resistance required in high light conditions. Onyx "has higher frame rates, lower noise, and can provide you with clearer images faster.
| Onyx Gadox detector | |
| Pixel resolution | 1.6MP |
| Frame rate | 25 fps |
| Effective pixel size | 70um |
| Effective imaging area (mm ^ 2) | 7800 |
| DAGE QuadraNTTMX-ray tube | |
| Light tube type | Mk4 15W enclosed transmission tube |
| Feature resolution | <750nm |
| Maximum target power | 15W |
| Voltage | 30-160kv |
| Detection | |
| Oblique view | 2x70 ° -360 degree observation of the sample can be achieved without rotating the sample. |
| Vibration-proof | Passive vibration reduction |
| Detectable area | 510x445mm (20x17.5 inches) |
| Geometric magnification | 2000 times |
| Image color depth | 16 bits |
| Monitor | 34 inch ultra wide display (3440x1440) |
| System | |
| Device dimensions | 1570 (width) x 1500 (depth) x 1900 (height) mm |
| System Weight | 1950 kg (4300 pounds) |
| Power supply | Single phase 200 to 230V AC, 50/60HZ, 16A 50/60Hz, 16A |
| Energy consumption | 1kW |
| Gas source | 5-8 bar clean and dry air for vibration isolation |
| Operating temperature | 10-30°C |
| Humidity | <85% no condensation water adhesion |
| Operation method | Mouse click |
| Software | Revalution |
| Operating system | Windows 10 64 bit operating system |
| X-ray safety | <1 microsieverts/hour Meets all relevant international standards |
| Optional accessories | |
| X-Plane® | No need for additional hardware to implement planar CT scanning |
| uCT | Creating high-resolution 3D models using the uCT platform |
| Barcode reader | Easily complete product traceability |
| Joystick | USB interface joystick module |
| Radiation filter disk | Reduce the dose of samples exposed to X-rays |
| Wafer tray | Used for placing 300mm and 200mm wafers |