The VUE400-P high-definition imaging exceeds modern standards and provides high-quality failure analysis capabilities for semiconductor manufacturing facilities. Based on the current platform and industry feedback, ODIS is the latest acoustic microscope software with rich technical content. Provide advanced analysis through quantitative software functions, suitable for measuring and classifying parts.
The offline analysis version of 0DIS allows customers to perform virtual scans on non scanning computers for the purpose of viewing and analyzing data, real-time analysis or collection of data, and review of results.
| Customer Interface | Dual HD 22 "LED display |  |
| Fixture | Pallet Fixture | |
| Instrumentation and meters | Digital pulse receiver Digital Converter (Max12 GHz) | |
| User experience characteristics | Double JEDEC tray High definition LED lighting stainless steel sink | |
| Maintenance free scanning of X-axis | Scanning axis: linear servo system Maximum scanning speed: 1500 mm/s Accuracy&Repeatability:+/-0.5 micron Scanning limit range: X-axis scanning range: 400mm Y-axis scanning range: 380mm Z-axis focusing range: 35 mm C-Scan range: 360mmx350mm T-Scan range: 360mm x 220mm Equipment weight: 250 Kg |
● Basic mode (simple user interface)
● Advanced mode (detailed analysis interface)
● Production mode (automatic scanning interface)
● Offline analysis mode (virtual scanning interface)
The VUE400-P high-definition imaging exceeds modern standards and provides high-quality failure analysis capabilities for semiconductor manufacturing facilities. Based on the current platform and industry feedback, ODIS is the latest acoustic microscope software with rich technical content. Provide advanced analysis through quantitative software functions, suitable for measuring and classifying parts.
The offline analysis version of 0DIS allows customers to perform virtual scans on non scanning computers for the purpose of viewing and analyzing data, real-time analysis or collection of data, and review of results.
● Product authenticity testing
● Product reliability testing
● Process effectiveness verification
● Supplier Qualification Verification
● Product inspection
● Quality control
● Failure analysis
● Research and experimental development
Provide high-quality resolution multi probe design to enhance scanning capability
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Hotline：86-0512-62749825
Phone：86-18912625555 Mr Chen
Email：alan.chen@winwintek.com/ wuj@winwintek.com
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