The VUE 250-P high-definition imaging exceeds modern standards and provides high-quality failure analysis capabilities for semiconductor manufacturing facilities. Based on the current platform and industry feedback, ODIS is the latest acoustic microscope software with rich technical content. Provide advanced analysis through quantitative software functions, suitable for measuring and classifying parts.
The offline analysis version of ODIS allows customers to perform virtual scans on non scanning computers for the purpose of viewing and analyzing data, real-time analysis or collection of data, and review of results.
| Maintenance free scanning X-axis: | Double HD 22” LED display |  | |
| Fixture | Open pedestal | ||
| Instrumentation and meters | Digital pulse receiver Digital Converter (Max 4 GHz) | ||
| User experience characteristics | High definition LED lighting stainless steel sink | ||
| Maintenance free scanning X-axis: | Scanning axis: linear servo system Maximum scanning speed: 500 mm/s Accuracy&Repeatability:+/-1.0 micron Scanning limit range: 322.6 mm | ||
| Low maintenance step Y-axis: | Limit range: 136 mm | ||
| Low maintenance focus on Z-axis: | Focus range: 35 mm | ||
| External dimensions: | 700 mm x 560 mm x 470 mm (W/D/H) 81 kg |
● Basic mode (simple user interface)
● Advanced mode (detailed analysis interface)
● Production mode (automatic scanning interface)
● Offline analysis mode (virtual scanning interface)
The VUE 250-P high-definition imaging exceeds modern standards and provides high-quality failure analysis capabilities for semiconductor manufacturing facilities. Based on the current platform and industry feedback, ODIS is the latest acoustic microscope software with rich technical content. Provide advanced analysis through quantitative software functions, suitable for measuring and classifying parts.
The offline analysis version of ODIS allows customers to perform virtual scans on non scanning computers for the purpose of viewing and analyzing data, real-time analysis or collection of data, and review of results.
● Product authenticity testing
● Product reliability testing
● Process effectiveness verification
● Supplier Qualification Verification
● Product inspection
● Quality control
● Failure analysis
● Research and experimental development
Provide high-quality resolution multi probe design to enhance scanning capability
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Email：alan.chen@winwintek.com/ wuj@winwintek.com
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