

MACROVUE-P imaging power surpasses modern standards deliveringpremium FA Lab features to semiconductor fabrication facilities.
ODIS is the latest Acoustic Microscopy Software with rich technicalcontent built on current platforms and industry feedback. Advanced analy-sis is provided through quantitative tools for measurement and classifica-tion of parts.
The Analysis version of ODlIS allows non-scanning computers to virtuallyscan, view, and analyze data for simultaneous real-time analysis or postcollection review.
OKOS is the first choice to customers looking for a SAM system because we leverage our flexibleODIS software, always ready to support, andpartnership with PVA TePla to provide compa-nies with the best possible SAM experience.
● We service customers worldwide through anextensive channel of distributors and representatives.
● We are the premier solutions provider of SAMsystems and instrumentation worldwide.
● We offer over 15 flexible and ready-to-usesystems and components.
● Multiple Zones
● Near Surface
● Sub Surface
● Inside Part
| Maintenance Free Scan Axis | Motor: Quad Linear Servo Scan Envelope: Up to 2500 mm Low Maintenance Step Axis |
| Low Maintenance Focus Axis | Focus Envelope: Up to 150 mm |
| Tank | Depth:Up to 300 mm |
| Customer Interface | Dual 27"HD LED Monitors |
| Fixtures | Custom Fixtures Optional Through Transmission LED illumination |
| Instrumentation | Digital Pulser Receiver Optional second channel Up to 12 GHz Digitizer |
| Scan Area | Up to 2500mm x 1500 mm |

MACRoVUE-P imaging power surpasses modern standards deliveringpremium FA Lab features to semiconductor fabrication facilities.
ODIS is the latest Acoustic Microscopy Software with rich technicalcontent built on current platforms and industry feedback. Advanced analy-sis is provided through quantitative tools for measurement and classifica-tion of parts.
The Analysis version of ODIS allows non-scanning computers to virtuallyscan, view, and analyze data for simultaneous real-time analysis or postcollection review.
● Basic (user friendly)
● Advanced (detailed analysis)
● Production (automated scanning)
● Offline Analysis (virtual scanning)
Application Specific Transducers for the highest quality resolution. Multiple transducer design for enhanced scan capability.

