86-18912625555

Home Products Reliability Testing Hanwa ESD electrostatic treatment HED-C5000R

HED-C5000R

HED-C5000R is a testing machine specifically designed for simulating Charged Device Model (CDM) to test the CDM failure level of packaged semiconductor components or modules.

●　Smaller size than competitors, low footprint, high testing efficiency;

●　Higher stability and repeatability in charging and discharging;

●　Suitable for multiple testing standards JEDEC, ESDA, AEC, JEITA, including ANSI/ESDA/JEDEC JS-002-2022 and AEC-Q100-011 (FI-CDM, D-CDM)

Product Manual

●　Built in automatic humidity control and N2 enclosed room.

●　Completely universal size/configuration output.

●　Automatic COM waveform acquisition system with waveform saving function.


ModelHED-C5000R
Test modelJEDEC/ESDA/AEC/JEITA
Test Capability1024 Pins or Hiaher
Test voltage0 to +/-4000V
Step voltage5V
Zap number1 to 100 times
Interval timeO to 10s
Test voltage accuracy1%+/-10V
Power source100-240V/2A 50/60Hz
Outer dimensions575mm(W)x4QOmm(D)x3QOmm(H)
Weight40Kg
OSWindows
Oscilloscope1 GHz/6GHz
X Y step I Z step0.05mm I 0.01 mm
Minimum Measurement area1mm x 1mm
Min. Pin/Burnp diameter0.1mm
Min. Pin/Burnp Pitch0.35mm


Operability
1.png

Zap device (grounding plane)

2.png

Equipment installation fixture (charging board)

3.png

Home screen


Feature

Smaller size than competitors, low footprint, high testing efficiency;

Higher stability and repeatability in charging and discharging;

Suitable for multiple testing standards JEDEC, ESDA, AEC, JEITA, including NSI/ESDA/JEDEC JS-002-2022 and AEC-Q100-011 (FI-CDM, D-CDM);

Copyright © 2026 Win-Win Electronic Technology International Limited　Su ICP NO.2025215884-1　Support：HuiCheng