HED-C5000R is a testing machine specifically designed for simulating Charged Device Model (CDM) to test the CDM failure level of packaged semiconductor components or modules.

●　Smaller size than competitors, low footprint, high testing efficiency;

●　Higher stability and repeatability in charging and discharging;

●　Suitable for multiple testing standards JEDEC, ESDA, AEC, JEITA, including ANSI/ESDA/JEDEC JS-002-2022 and AEC-Q100-011 (FI-CDM, D-CDM)

The HED-G5000 has the ability to simulate Human Body Model (HBM) and Machine Model (MM) discharge modes to test and evaluate the ESD resistance and level of packaged semiconductor components. It also supports latch up testing.

●　Supports up to 2048 test channels; Modular design allows for configuration upgrades to be completed on-site at the customer's site;

●　The special grounding design brings ultra-low parasitic capacitance, which meets the requirements of ANSI/ESDA/JEDEC JS-001-2023 for low parasitic capacitance devices;

●　Meet all electrostatic testing standards, including JEDEC, ANSI/ESDA/JEDEC JS-001-2023, AEC, MIL-STD-883, GJB, etc;

Compact in size, portable and portable 2-pinHBM and MM testing machine, capable of single machine testing without connecting to a computer. With a touch screen design and simple operation, it is particularly suitable for power devices and low pin count devices. Built in leakage testing unit, used to assist in determining whether the device has been damaged by ESD.