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Home Products Reliability Testing Hanwa ESD electrostatic treatment HED-G5000

HED-G5000

The HED-G5000 has the ability to simulate Human Body Model (HBM) and Machine Model (MM) discharge modes to test and evaluate the ESD resistance and level of packaged semiconductor components. It also supports latch up testing.

●　Supports up to 2048 test channels; Modular design allows for configuration upgrades to be completed on-site at the customer's site;

●　The special grounding design brings ultra-low parasitic capacitance, which meets the requirements of ANSI/ESDA/JEDEC JS-001-2023 for low parasitic capacitance devices;

●　Meet all electrostatic testing standards, including JEDEC, ANSI/ESDA/JEDEC JS-001-2023, AEC, MIL-STD-883, GJB, etc;

Product Manual

●　Adaptable to the following international standard waveform;ESDA_JEDEC JS-001(AEC), JEITA

●　This system' s uniquely short discharge circuit is made possible by its original mechanicaldesign. The short circuit minimizes the influence of inductance and capacitance on thedata. Further, the use of a single circuit ensures data stability for each device pin tested.


Design BaseMechanical
MatrixNo relay system
Test ModelHBM, MM, & Latch Up Customize Available
Test Level

HBM:10V to 8kV step 5V

MM:10Vto 4kVstep 5V

Latch Up:100V/1A, 35V/1A

Latch UpJESD78 with Vector Option
Vector10MHz max, 0.5-5V, 256kdepth,
Pin countMax2048 Customize Available
Dimensions200cm(W)x105cm(D)x150cm(H)Depend on System
Weight500kg
Operation SystemWindows
AC Voltage100 -240V/20A
Bias Supply and Current PulseBias Supply:35V/1A, Min Step Voltage 0.1V
For Latch-Up Test(512pins)Current Pulse:10mA-1000mA, Min Step Current 10mA


Application View
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Condition

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Measurement

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Graph mode


Feature

Supports up to 2048 test channels; Modular design allows for configuration upgrades to be completed on-site at the customer's site;

The special grounding design brings ultra-low parasitic capacitance, which meets the requirements of ANSI/ESDA/JEDEC JS-001-2023 for low parasitic capacitance devices;

Meet all electrostatic testing standards, including JEDEC, ANSI/ESDA/JEDEC JS-001-2023, AEC, MIL-STD-883, GJB, etc;

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