Suitable for high-temperature dynamic aging screening and lifespan testing of various packaging forms of analog, digital, and mixed signal integrated circuits, including ultra large scale integrated circuits such as SoC, MCU, Memory, and other IC devices.
The circuit design has low ripple, low overshoot, high current, anti-interference characteristics, and complete functions of overvoltage, overcurrent, and overtemperature protection
Configurable digital signal generation capability of up to 20M, with excellent high-frequency digital signal transmission and matching design
Configure 4-channel analog signal generation and driving module, which can be well applied to the experimental loading of analog and mixed signal ICs
Configure a 64 channel digital signal detection circuit that can real-time check the frequency and amplitude parameters of the DUT output signal; High end model configuration TDBI logic function testing
| High Temperature Test Chamber | Maximum test temperature: 85 ℃/125 ℃/150 ℃ | |
| Capacity | 16 channels; 208 workstation - single board; 3328 workstation - complete machine (DIP14 as an example) | |
| Test power supply | 10 units; Range: ± 20V/60A | |
| Drive detection board | Quantity | 16 |
| Vcc/Vmux/Vclk | 2.00V～18.00V / 10A | |
| Vee | -2.00V～-18.00V / 10A | |
| Ripple (effective value) | ＜10mV | |
| Analog signal (4 channels) | 1MHz，0V～±10.0V / 1.0A | |
| Digital signal (64 channels) | 10 / 20MHz；8Mb向量深度 | |
| Addressing capability | 64G bits | |
| Return inspection signal | Frequency and amplitude | |
Temp.range | Ambient |  |
BIB Slots | 1 Slots ( Horizontal ) | |
Driver board | 1 | |
DPS | 8 supplies 0.0~9.5V, 2mV resolution Maximum output: 60A, 240W Accuracy: ±0.3% of output voltage±10mV Ripple & noise:30mV peak to peak 2 supplies 0.0~5.0 V, 2 mV resolution | |
Other | 90cm Height * 70cm Width * 1200cm depth; 120kg; A.C.220V,50Hz |
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