Develop and design according to the requirements of AEC-Q101 standard, covering intermittent life test IOL and steady-state life test CFL for Si/SiC/GaN discrete devices such as diodes, transistors, MOSFETs, IGBT single tubes, etc; The system can intuitively monitor the Δ Tj of each DUT throughout the entire IOL test process.
Single channel 80 workstations, capable of meeting 77Pcs/batch, optimized structural design can meet testing in the same physical heat dissipation environment
Different packaging forms are configured with different daughter boards, enhancing the versatility of the motherboard and the flexibility of the daughter boards, covering both normally open and normally closed devices, greatly reducing the cost of later use
The optimized high-speed acquisition circuit can achieve continuous sampling of up to 80 workstations on the entire board, with a sampling time of approximately 500uS, ensuring authenticity and accuracy
MOS transistor: It can be used in both channel loading mode and aging mode with body diode Ih heating, with 24/48/80 station options available
| Air cooled test chamber | 16 sets; Room temperature air-cooled type | |
| Capacity | Series mode: Single board 80 stations simultaneously detect △ Tj/whole machine 1280 stations; Parallel mode: Single board 48 stations simultaneously detect △ Tj/whole machine 768 stations | |
Test power supply | (0-60V / 2400W) * 16 | |
Drive detection board | Quantity | 16 |
Constant current source | Single board 4-channel 20A constant current source output, Parallel connection can reach 60A and can be used for IGBT single tube; | |
Test voltage detection | 0.00V～99.9V； Accuracy: ± (1%+1LSB); | |
Test current detection | Id detection range: 0.1A~20.0A (diode/MOS/IGBT); 0mA~400mA (transistor/MOS) | |
Vf detection accuracy | ±1mV | |
Im occurrence range | 0~99.9mA ; Accuracy: ± (1%+1LSB) | |
TJ junction temperature test | 20℃～175℃； Accuracy: ± (1%+1LSB) | |
Temperature range | 25℃～175℃； |  |
Capacity | Single channel, testing 12 DUTs at once, Take the average value to obtain a more representative K-line | |
Drive detection board | Im current detection occurs: ± 1.0mA - ± 99.9mA; Accuracy: ± 1%+0.1mA Vf sampling range: 0.00~4.00V; Accuracy: ± 0.5%+0.2mV |
Temperature range | -70℃ ~ +150℃ |  |
| Temperature change rate | ≥15 ℃/min； Power interval: adjustable from 1min to 10min | |
| Capacity | 8 test channels, 64/80 workstation single board; 512/640 workstation complete machine | |
| Test power supply | 4 units of 100V/7.5A+4 units of 20V/35A | |
| Drive detection board | Single board 16 channel 1mA~100mA constant current electronic load, 8 pieces Test current detection range: 0.0~100.0mA; accuracy 1% ± 2LSB Test voltage detection range: 0.0~100.0V; accuracy 1% ± 1LSB |
【 WeChat 】
Address：No. 501, Building 01, Northwest District, Suzhou Nano City,
No. 99, Jinjihu Avenue, Suzhou Industrial Park
Hotline：86-0512-62749825
Phone：86-18912625555 Mr Chen
Email：alan.chen@winwintek.com/ wuj@winwintek.com
Copyright © 2026 Win-Win Electronic Technology International Limited Su ICP NO.2025215884-1 Support：HuiCheng