Satisfy high-temperature reverse bias/gate bias testing (HTRB/HTGB) and high-temperature leakage current testing (HTIR) for various packaging forms of semiconductor discrete devices such as diodes, transistors, field-effect transistors, IGBT single tubes, and thyristors.
The maximum test temperature of the oven can be selected as 150/175/200 ℃, and the equipment can replace the corresponding temperature resistant wires and aging boards with different temperature resistance
Based on the hardware configuration of the X series, the system automatically identifies the over limit alarm station and continuously captures the last 50-100 data of the station at intervals of 2 seconds
When the experiment is started, the system automatically loads temperature/test voltage and other conditions into the opening area according to the upper computer software settings
Real time monitoring of test parameters and over limit status of all experimental workstations throughout the entire experiment process, facilitating user failure analysis
| High Temperature Test Chamber | Maximum test temperature: 150/175/200 ℃; Uniformity: ± 3 ℃ at 150 ℃; Volatility: ± 0.5 ℃; |
| Capacity | 16 channels; 80 workstations - single board; 1280 workstation - complete machine |
| Test power supply | 4 units; Range: Max 2000V |
| Drive detection board | |
| Quantity | 16 |
| Voltage detection range | 0.0V～2000.0V； Resolution: 0.1V; Accuracy: ± (1% rdg.+1) V |
| Leakage current detection range | 0.001μA～50.0mA； Resolution: 0.001 μ A; Accuracy: ± (0.1% rdg.+0.01) μ A |
*Multiple units can be connected in parallel at the same time to achieve centralized monitoring and management, as well as larger capacity and multi temperature zone testing
High temperature reverse bias/grid bias test system
● Equipped with RB/GB automatic switching function
● RB/GB aging board universal
● PA level sampling accuracy
● Single station automatic cutting function
High temperature reverse bias test system for microwave devices
● GaN device specific
● Dual power loading (independent negative pressure cutoff)
● Single station relay automatic switching function
High temperature reverse bias test system (large capacity)
● 32 channels, large
● Adapt to the requirements of large-scale testing
● Multiple protections for the entire machine
High temperature reverse bias test system (small capacity)
● 8 channels, small
● Adapt to small batch testing requirements
● Multiple protections for the entire machine
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Address：No. 501, Building 01, Northwest District, Suzhou Nano City,
No. 99, Jinjihu Avenue, Suzhou Industrial Park
Hotline：86-0512-62749825
Phone：86-18912625555 Mr Chen
Email：alan.chen@winwintek.com/ wuj@winwintek.com
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