Ultra high resolution field emission scanning electron microscope SU8600 series

With the development of rapid data collection and processing technology, electron microscopes have entered an era where not only data quality but also the collection process are valued. The SU8600 series adheres to the high-quality imaging, large beam analysis, and long-term stable cold field imaging technology of the Regulus 8200 series, while greatly improving high-throughput and automatic data acquisition capabilities.

Flagship model

Combining excellent performance, easy operation, and diverse functions; Configure multiple operation assistance functions to support a series of processes from sample installation to testing; With the enhancement of various automation functions, operational performance has been further optimized; A detector that can meet various observation needs; Equipped with a multifunctional oversized sample compartment as standard, supporting analysis of large samples; Support full field of view movement, SEM MAP supports full field of view observation of oversized samples; Can provide application solutions that meet testing requirements; Equipped with a multifunctional oversized sample compartment and a wide range of accessories

Support large-scale sample testing

Combining excellent performance, easy operation, and diverse functions; Configure multiple operation assistance functions to support a series of processes from sample installation to testing; With the enhancement of various automation functions, operational performance has been further optimized; A detector that can meet various observation needs; Equipped with a multifunctional oversized sample compartment as standard, supporting analysis of large samples; Support full field of view movement, SEM MAP supports full field of view observation of oversized samples; Can provide application solutions that meet testing requirements; Equipped with a multifunctional oversized sample compartment and a wide range of accessories