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法国INSIDIX热变形

 上下双面加热;

 PID独立调控上下面温度,温差小;

 非连续面测试;

 BGA免去球测试;

 Warpage与CTE可同时测试;

 高分辨率相机1200万像素;

 可同时测试不同器件。

Full modularity and flexibility

Precise warpage and CTE measurement on a nano micrometer scale across a temperature range of -65°C to 400°C

Smaller footprint

Noise level < 50 dB

Redesigned oven

New CTE module with improved resolution

OCT sensor enabling nano-resolution measurement on transparent, semitransparent, and glossy surfaces

Precise warpage and CTE measurement on a nano micrometer scale across a temperature range of -65°C to 400°C

Full modularity and flexibility

 Precise warpage and CTE measurement on a micron scale across temperature range of RT to 300°C

 Scanning and multiscale available

Full modularity and flexibility

 Precise warpage and CTE measurement on a micron scale across temperature range of RT to 300°C

 Scanning and multiscale available