●　Ultra high resolution and high contrast imaging capabilities of non-magnetic nanomaterials.

●　Unique in tube detector design: TriBE^TM detector system and TriSEM^TM detector are more suitable for nanomaterial characterization.

●　 Implement energy filtering function for backscattered electron detectors inside the lens barrel.

●　The In Flight BeamTracking technology achieves optimal imaging and analysis conditions.

●　Intuitive and modular Essence^TM software, which can be proficiently operated by personnel of any level of proficiency.

TESCAN AMBER 2 Gallium Ion Dual Beam Focused Scanning Electron Microscope System (FIB-SEM)

The fully automated gallium (Ga) ion FIB-SEM system enables easy preparation of conventional samples, fine characterization of nanoscale samples, and application of multifunctional prototype design

The perfect combination of unique leak free magnetic ultra-high resolution SEM and plasma FIB, with high precision and efficiency, provides the most comprehensive solution for multimodal material characterization and TEM sample preparation

The first integrated, spiral assisted analytical near ultra-high vacuum 4D-STEM

TESCANTENSOR is the world's first professional 4D-STEM for multimodal characterization of the nano morphology, chemical, and structural properties of functional materials, films, natural and synthetic particles, with outstanding 4D-STEM performance and unprecedented universality.